Blemish Checker for FPD NM Series
High-speed, high-precision detection and measurement of coating unevenness in liquid crystal panel color filters
Detecting failures and uneven points on color resist film coated by Toray’s Coater.
Toray’s customized algorithm achieved fast throughput and high resolution.
- High performance of detection specialized in the Mura of Toray’s coater.
- High reliability of system. (movable part is only conveyer)
- Fast checking speed on a par of coating speed of Toray’s Coater.
- Improve the yield of production of Color Filter Panel
- Cut down start losses
- Prevent the outflow of inferior panels
|Substrate Size||Can support up to G10 substrate depending on the number of cameras|
|Application||Pattern resin BM, R, G, B, OC, PS (CS)
Transparent film pre-patterning substrates
|Cheking System||Monochromatic CCD camera + LCD light source|
|Detectable MURA||Mura arising from Toray'’s coater
(V-Line, H-Line, V-Mura, H-Mura, White-Pin, White-Boke, Other)
|Tackt-time (Reference)||35 sec/G8 (including substrate switch-out time)|
|Outer Dimension||6000(W) × 3200(D) × 2500(H)/G8|
|Weight||Approx. 5,000 kg|
|Utilities||AC 220 V ± 10 %, Pressure Air, Exhaust|
- Related terms
- Coating unevenness
- Unevenness inspection
- Linear unevenness
- Pin unevenness
- CONTACT US
Shiga office: +81-77-544-1892