December 5, 2023

TASMIT to exhibit at “SEMICON Japan 2023”

TASMIT, Inc. will exhibit at "SEMICON Japan 2023" held from December 13 (Tue.) through 15 (Fri.), 2023.
This year's exhibition will be held jointly with Toray Group company.
TASMIT will feature variations of Wafer Inspection System "INSPECTRA Series" and provide semiconductor inspection and measurement equipment that serves a variety of applications.

Below are additional details about the exhibition.

Exhibition name SEMICON Japan 2023
Date December 13 to 15, 2023
Venue Tokyo Big Sight East Hall 5, 5308 Booth8
Official website https://www.semiconjapan.org/en/
Exhibition Wafer Inspection System "INSPECTRA" Series
Luminescence Defect Inspection System "INSPECTRA PL" Series for Mini・Micro LED
Luminescence Defect Inspection System "INSPECTRA PL" Series for Power devices (GaN, SiC)
Wafer internal defect inspection system "INSPECTRA® IR" Series
AI-ADC (Automatic Defect Classification) system
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