About TASMIT

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Electron Beam
Semiconductor Wafer
Pattern Verification System

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Optical
Semiconductor Wafer
Inspection System

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Innovation to Reality

TASMIT nanotechnology creates the new world for semiconductor inspection and metrology.

Apr. 22, 2020NewsNEW
Paper at "SPIE Advanced Lithography 2020"
Apr. 1, 2020NewsNEW
Website has been renewed!
Jan. 6, 2020News
Happy New Year
Dec. 25, 2019News
Our New Year’s holiday