August 5, 2026
TASMIT to Exhibit at SEMICON Taiwan 2026
TASMIT, Inc. will exhibit at SEMICON Taiwan 2026, which will be held from September 2 (Wed.) to September 4 (Fri.), 2026. This year again, TASMIT will exhibit jointly with Toray Industries, Inc., Toray Plastics Precision Co., Ltd. and Toray Research Center, Inc., Toray Engineering Co., Ltd. TASMIT will showcase variations of its wafer inspection system, the INSPECTRA Series, offering semiconductor inspection and measurement solutions for a wide range of applications. TASMIT will also exhibit a large-format glass substrate inspection system for advanced semiconductor packaging applications, the first in the industry to enable both double-sided inspection and internal defect detection.
Further details about the exhibition are provided below.
| Exhibition name | SEMICON Taiwan 2026 |
|---|---|
| Date | September 2 (Wed.) - 4 (Fri.), 2026 |
| Venue | Taipei Nangang Exhibition Center, Booth I2130 |
| Official website | https://semicontaiwan.org/en |
| Exhibition | Optical Semiconductor Wafer Inspection System: INSPECTRA SR-Ⅳ Large Glass Substrate Inspection System for Advanced Semiconductor Packaging Luminescence Defect Inspection System: INSPECTRA PL Series for Power Devices (GaN, SiC) Luminescence Defect Inspection System: INSPECTRA PL Series for Mini/Micro LED Wafer Internal Defect Inspection System: INSPECTRA IR Series for MEMS, SiPh, ASIC Overlay Measurement System: OM-7000H Electron Beam Semiconductor Wafer Pattern Verification System: NGR 5000Series |