October 23, 2025

TASMIT to Exhibit at SEMICON Europa 2025

TASMIT, Inc. will exhibit at SEMICON Europa 2025, taking place from Tuesday, November 18 to Friday, November 21, 2025.
This year, TASMIT will exhibit jointly with Toray Industries, Inc.
TASMIT will showcase variations of its wafer inspection system, the INSPECTRA Series, offering semiconductor inspection and measurement solutions for a wide range of applications.

Further details about the exhibition are provided below.

Exhibition name SEMICON Europa 2025
Date November 18–21, 2025
Venue Booth C1810, Hall C1, Messe München
Official website https://www.semiconeuropa.org/
Exhibition Wafer Inspection System: INSPECTRA Series
Wafer Inspection System: INSPECTRA FR Series
Luminescence Defect Inspection System: INSPECTRA PL Series (for SiC and GaN)
Wafer Internal Defect Inspection System: INSPECTRA IR Series (for MEMS, SiPh, ASIC)
Overlay Measurement System: OM-7000H
Large Glass Substrate Inspection for Next-Generation Semiconductor Packaging
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