December 4, 2025

TASMIT to Exhibit at SEMICON Japan 2025

TASMIT, Inc. will exhibit at SEMICON Japan 2025, taking place from Wednesday, December 17 to Friday, December 19, 2025.
This year, TASMIT will exhibit jointly with Toray Industries, Inc, Toray Research Center, Inc. and Toray Precision Co., Ltd., Toray Engineering Co., Ltd.
TASMIT will showcase variations of its wafer inspection system, the INSPECTRA Series, offering semiconductor inspection and measurement solutions for a wide range of applications.

Further details about the exhibition are provided below.

Exhibition name SEMICON Japan 2025
Date December 17-19, 2025
Venue Tokyo Big Sight, East Hall 4, Booth E4908
Official website https://www.semiconjapan.org/en
Exhibition Optical Semiconductor Wafer Inspection System: INSPECTRA Series / FR Series
Luminescence Defect Inspection System: INSPECTRA PL Series for Power Devices (GaN, SiC)
Luminescence Defect Inspection System: INSPECTRA PL Series for Mini/Micro LED
Wafer Internal Defect Inspection System: INSPECTRA IR Series for MEMS, SiPh, ASIC
Overlay Measurement System: OM-7000H
Large Glass Substrate Inspection System for Advanced Semiconductor Packaging
Electron Beam Semiconductor Wafer Pattern Verification System: NGR Series
High-Accuracy Automatic Defect Classification Powered by AI: AI-ADC
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