November 26, 2024

TASMIT to exhibit at “SEMICON Japan 2024”

TASMIT, Inc. will exhibit at "SEMICON Japan 2024" held from December 11 (Wed.) through 13 (Fri.), 2024.
This year's exhibition will be held jointly with Toray Group company.
TASMIT will feature variations of Wafer Inspection System "INSPECTRA® Series" and provide semiconductor inspection and measurement equipment that serves a variety of applications.

Below are additional details about the exhibition.

Exhibition name SEMICON Japan 2024
Date December 11 to 13, 2024
Venue Tokyo Big Sight Hall 5, 5507 Booth
Official website https://www.semiconjapan.org/jp
Exhibition Wafer Inspection System "INSPECTRA®" Series
Luminescence Defect Inspection System "INSPECTRA® PL" Series for Mini・Micro LED
Luminescence Defect Inspection System "INSPECTRA® PL" Series for Power devices (GaN, SiC)
Wafer internal defect inspection system "INSPECTRA® IR" Series
Overlay measurement system "OM-7000H"
AI-ADC (Automatic Defect Classification) system
INSPECTRA® Series for PLP
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