March 13, 2024

TASMIT to exhibit at “SEMICON China 2024”

TASMIT, Inc. will exhibit at "SEMICON China 2024" held from March 20 (Wed.) through 22 (Fri.), 2024.
This year's exhibition will be held jointly with Toray Group company.
TASMIT will feature variations of Wafer Inspection System "INSPECTRA Series" and provide semiconductor inspection and measurement equipment that serves a variety of applications.

Below are additional details about the exhibition.

Exhibition name SEMICON China 2024
Date March 20 to 22, 2024
Venue Shanghai New International Expo & Conference (SNIEC) Ｎ2-2820
Official website https://www.semiconchina.org/
Exhibition Wafer Inspection System "INSPECTRA" Series
Wafer Inspection System "INSPECTRA FR" Series
Luminescence Defect Inspection System "INSPECTRA PL" Series for Mini/Micro LED
Luminescence Defect Inspection System "INSPECTRA PL" Series for Power devices (GaN, SiC)
back to index

Inquiries