October 19, 2026
TASMIT to Exhibit at SEMICON Europa 2026
TASMIT, Inc. will exhibit at SEMICON Europa 2026, which will be held from November 10 (Tue.) to November 13 (Fri.), 2026, at Messe München in Munich, Germany.
At our booth, we will present panels featuring semiconductor inspection and measurement systems from the INSPECTRA Series: the INSPECTRA SR-Ⅳ Optical Semiconductor Wafer Inspection System, the INSPECTRA IR Series Wafer Internal Defect Inspection System, and the OM-7000H Overlay Measurement System.
The panels will introduce the features of each system and our inspection and measurement solutions for a wide range of semiconductor applications. We look forward to welcoming you to our booth.
Further details about the exhibition are provided below.
| Exhibition name | SEMICON Europa 2026 |
|---|---|
| Date | November 10 (Tue.) - 13 (Fri.), 2026 |
| Venue | Messe München, Munich, Germany Booth: #B1846 |
| Official website | https://portal2026.semiconeuropa.org/home |
| Exhibition | Optical Semiconductor Wafer Inspection System: INSPECTRA SR-Ⅳ Wafer Internal Defect Inspection System: INSPECTRA IR Series Overlay Measurement System: OM-7000H |