Greeting

Hideyuki Sakaizawa
President & CEO

TASMIT, Inc. was established as the integrated company with the optical semiconductor wafer inspection system business of Toray Engineering Co., Ltd. and the electron beam semiconductor wafer pattern verification system business of NGR, Inc. which is the subsidiary company of Toray Engineering Co., Ltd. on December 1, 2019.

The optical semiconductor wafer inspection system “INSPECTRA” with high speed performance has been used for the 100% wafer inspection of the semiconductor device manufacturing, the power device applications, the LED applications and so on.

The electron beam semiconductor wafer pattern verification system “NGR” with wide FOV electron beam microscope image and Die-to-Database algorithm has been used for the most advanced semiconductor manufacturing as the yield enhancement system.

TASMIT goal is to enhance the current two businesses and provide the new solutions with optical and electron beam technologies.

TASMIT promises to push on toward the effective systems for the semiconductor device manufacturing as the company specialized in semiconductor metrology and inspection system business.

We greatly appreciate your continued support and look forward to working with you.

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